Fabrication Services

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Fabrication Services

Kyma is ready to team with you to bring your novel device ideas to life from concept, to layout, to reality.Utilizing a wide range of design, simulation, and fabrication experience, Kyma can help with epi design, contact and dielectric schemes, as well as multi-level mask layouts. Kyma has access to a full suite of device processing facilities, supporting fabrication of all types of semiconductor devices including field effect transistors (FETs), Schottky barrier diodes, light emitting diodes (LEDs), and photoconductive semiconductor switches (PCSS). We can also validate your devices or films with routine Materials Characterization (XRD, AFM, XPS, SEM, etc) as well as electrical IV and CV measurements. If there are any additional processes you would like us to carry out for you just ask. Our network of partners enable Kyma to access most any type of well established semiconductor processing capabilities.Recent testimonials about Kyma's device design & fabrication services appeared in both the FY16 Nevada National Security Site R&D Report and the FY17 Nevada National Security Site R&D Report.

Product Details


  • Comprehensive in-house and external characterization techniques
  • Electrical resistivity measurements (5x104 to 5x109 Ohm-cm) for bulk and thin films
  • Surface morphology mapping using white light interferometry
  • Contactless thin film thickness measurements (150Å to 450µm)
  • Contactless thickness mapping and bow measurements (up to 4 inches)
  • X-ray diffraction (XRD) analysis including rocking curves, reciprocal space maps, and simulations
  • Access to advanced techniques like AFM, SIMS, Raman, SEM, TEM, and optical spectroscopy


  • In-depth analysis of structural, electrical, optical, and physical material properties
  • Optimization of compound semiconductor materials and device performance
  • Comprehensive characterization data for successful product development
  • Insights into process optimization and defect identification
  • Streamlined characterization services from a single provider
  • State-of-the-art facilities and expertise in compound semiconductor analysis\


  • Characterization of III-Nitride (GaN, AlN, InN) materials and devices
  • Analysis of II-VI and oxide semiconductor materials
  • Evaluation of advanced optoelectronic and electronic materials
  • Characterization of epitaxial layers and device structures
  • Investigating novel compound semiconductor materials
  • Process monitoring and quality control
  • Failure analysis and root cause identification

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